I know John is working on an update to allow REW to automate measurements over a range of input/output levels, but in the meantime are there any helpful shortcuts to measuring the linearity of a device over a pertinent range of signal levels? I'm looking at testing the bit nonlinearity of a few DACs so that I can share the data with a couple of online sites.
I do have a pretty precise interface (Scarlett 2i2) that will be sufficient for the measurement. Assuming there is no easy alternative, the plan is to set the signal generator to a certain value and then look at the return value with the "SPL Meter", with both of course set to use the Scarlett interface and (after doing calibration) insert the DUT. I'll probably also use REW's scope so that I can see when I'm approaching the noise floor. Is there a better approach at present?
I do have a pretty precise interface (Scarlett 2i2) that will be sufficient for the measurement. Assuming there is no easy alternative, the plan is to set the signal generator to a certain value and then look at the return value with the "SPL Meter", with both of course set to use the Scarlett interface and (after doing calibration) insert the DUT. I'll probably also use REW's scope so that I can see when I'm approaching the noise floor. Is there a better approach at present?