Feature request

oliver

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Hello John,
I use an RME fireface UC multi-channel card on Mac OSX Ventura, so I can make SPL and Impedance measurements one after the other.
Do you think would be possible to add the feature that REW stores the channels used and recalls them depending on the type of measurement selected (SPL or Impedance)?

Thank you,
Oliver
 
That would be difficult with the current UI. Impedance measurement might use a different interface rather than just different channels. It is probably something to handle as part of a wider revamp of the UI to a more task-centric approach, but I have no timescale for that.
 
Thanks anyway John.
One more question, I do have a huge database of drivers for comparison, do you think it could be possible to increase the "Maximum measurements" setting to 250 or even more?
Thank you.
Oliver
 
Meaning you want an overlay graph with more than 200 measurements? Wouldn't it be difficult to see anything on such a graph?
 
Yes,
but I usually switch all of them off and switch on some for comparison.
 
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